SPCM · Optoelectronic mapping
Scanning
Photocurrent
Microscopy
A modular optoelectronic workstation for spatially resolved mapping of photoresponse, charge transport and local electric-field distributions.
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01 / Overview
Material characterization
Spatially resolved insight into optoelectronic behavior.
The LST SPCM combines an adaptable optical train, dual-axis galvanometer scanning and dedicated signal-recovery paths in a compact platform developed for advanced materials and micro-scale semiconductor devices.
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Optical vector scanning for controlled spatial mapping
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Photocurrent mapping for localized photoresponse measurements
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Reflection mapping for spatial correlation and feature alignment
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Integrated control and acquisition through purpose-built software
02 / Measurement
Photocurrent + reflection
Correlated maps from a single platform.
Concurrent photocurrent and reflection acquisition connects electrical photoresponse with optical structure, helping researchers align measured behavior with device features.
03 / Control software
Integrated acquisition
Control, visualize and inspect from one interface.
The cross-platform control suite brings scan setup, instrument synchronization, live mapping, line-profile analysis and data export into the measurement workflow.
04 / System architecture
Modular by design
Adaptable optics. Integrated control.
The open-frame architecture is designed around configurable optomechanics and infinity-corrected optics, allowing key optical and sample-handling elements to be adapted for specific research requirements.
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Configurable excitation and optical components
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Camera-assisted sample navigation and alignment
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Dedicated signal recovery and instrument synchronization